SNJ54BCT8374AJT Texas Instruments

Manufacturer: Texas Instruments
Manufacturer PN: SNJ54BCT8374AJT
Description: SCAN TEST DEVICES WITH OCTAL D-T
Detailed Description: Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-CDIP
Package: 24-CDIP (0.300", 7.62mm)
Mfr: Texas Instruments
Series: 54BCT
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage: 4.5V ~ 5.5V
Number of Bits: 8
Operating Temperature: -55°C ~ 125°C
Mounting Type: Through Hole
Package / Case: 24-CDIP (0.300", 7.62mm)
Supplier Device Package: 24-CDIP