SNJ54BCT8374AFK Texas Instruments

Manufacturer: Texas Instruments
Manufacturer PN: SNJ54BCT8374AFK
Description: SCAN TEST DEVICES WITH OCTAL D-T
Detailed Description: Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 28-LCCC (11.43x11.43)
Package: 28-CLCC
Mfr: Texas Instruments
Series: 54BCT
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage: 4.5V ~ 5.5V
Number of Bits: 8
Operating Temperature: -55°C ~ 125°C
Mounting Type: Surface Mount
Package / Case: 28-CLCC
Supplier Device Package: 28-LCCC (11.43x11.43)