SN74BCT8374ADW Texas Instruments

Артикул SN74BCT8374ADW Texas Instruments

Описание

Manufacturer: Texas Instruments
Manufacturer PN: SN74BCT8374ADW
Description: IC SCAN TEST DEVICE W/FF 24-SOIC
Detailed Description: Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Package: Bulk
Mfr: National Semiconductor
Series: -
Base Product Number: 93S43